ENCLOSURE FOR TESTING ELECTRONIC DEVICES
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United States of America Patent
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Issued Date -
Jul 11, 2024
app pub date -
Sep 19, 2023
filing date -
Oct 16, 2017
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Abstract
Various devices and techniques help to reduce the entry of unwanted radio waves into an enclosure and reduce the reflection of radio waves inside the enclosure. Such devices and techniques enable a test environment inside the enclosure that provides high-quality functionality and performance testing.
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