IMAGE SENSOR AND FABRICATION METHOD THEREOF

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United States of America Patent

APP PUB NO 20240234599A1
SERIAL NO

18405661

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Abstract

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An image sensor includes a first substrate and a photoelectric structure in the first substrate. The first substrate includes opposite first surface and second surfaces. The conductivity type of the photoelectric structure is opposite to that of the first substrate. The photoelectric structure includes a second doped region and multiple first doped regions. Each of the first doped regions is connected to the second doped region. The distance from the second doped region to the first surface is smaller than the distance from the first doped region to the first surface. The size of the first doped region in a direction parallel to the first surface is smaller than or equal to the size of the second doped region in the direction. The quantum efficiency (QE), detection band, and photo-sensing capability are improved.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATIONNO 18 ZHANGJIANG ROAD CHINA (SHANGHAI) PILOT FREE TRADE ZONE PUDONG NEW AREA SHANGHAI 201203 201203
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION100176 BEIJING BEIJING DAXING DISTRICT ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE (YIZHUANG) 18 WENCHANG AVENUE MUNICIPAL DISTRICT BEIJING CITY 100176

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GAO, Changcheng Beijing, CN 2 0
SHI, Qiang Beijing, CN 18 158
YAN, Dayong Beijing, CN 4 0
ZHANG, Wei Beijing, CN 2625 19909

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