MEASUREMENT DATA ANALYSIS DEVICE, MEASUREMENT DATA ANALYSIS METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING MEASUREMENT DATA ANALYSIS PROGRAM
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United States of America Patent
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Issued Date -
Jul 4, 2024
app pub date -
Dec 26, 2023
filing date -
Dec 28, 2022
priority date (Note) -
Published
status (Latency Note)
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Abstract
A measurement data analysis device analyzes measurement data of a sample obtained in an analyzer, and includes a noise variation estimator that estimates a noise variation coefficient, the noise variation coefficient being applied to a noise included in the measurement data by a frequency filter included in the analyzer, an acquirer that acquires the measurement data to which the frequency filter has been applied in the analyzer, and a calculator that estimates, with use of the noise variation coefficient, a noise intensity included in the measurement data obtained before the frequency filter is applied, and analyzes, based on the estimated noise intensity, the measurement data.
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