BIOMETRIC INFORMATION MEASUREMENT DEVICE AND METHOD OF MANUFACTURING BIOMETRIC INFORMATION MEASUREMENT DEVICE

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United States of America Patent

APP PUB NO 20240215842A1
SERIAL NO

18544815

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Abstract

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A biometric information measurement device includes: a layered film including a plurality of layered layers including two or more types of layers having different refractive indices; and a light receiving element configured to receive light transmitted through the layered film and generate a signal corresponding to the light.

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Patent Owner(s)

Patent OwnerAddress
SHARP SEMICONDUCTOR INNOVATION CORPORATIONNARA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujio, Masayuki Tenri City, JP 14 154
Funao, Daisuke Tenri City, JP 9 69
Hida, Sota Tenri City, JP 4 0
Kobayashi, Kohji Tenri City, JP 7 50
MOCHIZUKI, YUTA Tenri City, JP 8 3
Shibata, Keiichi Tenri City, JP 17 134

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