GAIN AND OFFSET DIAGNOSIS OF ANALOG-TO-DIGITAL CONVERTERS IN SENSOR SIGNAL PATH

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United States of America Patent

APP PUB NO 20240213997A1
SERIAL NO

18146641

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Abstract

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A sensor circuit, having a startup phase and an operation phase, includes: a sensor configured to generate a sensor signal based on a measured property, wherein the sensor signal has a frequency spectrum defined by a first frequency and a second frequency that is greater than the first frequency; a signal processing circuit including an analog-to-digital converter (ADC) configured to convert the sensor signal into a digital sensor signal; and an offset diagnosis circuit. The offset diagnosis circuit includes: a low pass filter having a cutoff frequency less than the first frequency and configured to generate a filtered signal based on the digital sensor signal; an offset register configured to store a startup signal value of the filtered signal during the startup phase; and an offset comparator circuit configured to set a threshold range based on the startup signal value for use during the operation phase.

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Patent Owner(s)

Patent OwnerAddress
INFINEON TECHNOLOGIES AGCAMPBELL 1-15 NAUBIBERG GERMANY NEUBIBERG BAVARIA

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BÖHM, Matthias Putzbrunn, DE 11 46
BUFFA, Cesare Villach, AT 13 46
BUICULESCU, Vlad Bucharest, RO 4 31
CASPANI, Alessandro Villach, AT 10 4
CRISU, Constantin Bucharest, RO 6 0
DARRER, Franz Michael Graz, AT 29 114
STOICA, Dan Ioan Dumitru Bucharest, RO 4 0
STROI, Constantin Bucharest, RO 3 1

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