System and method for testing a phase noise or jitter of a phase-locked loop
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jun 27, 2024
app pub date -
Dec 23, 2022
filing date -
Dec 23, 2022
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A system and method for testing or determining a phase noise and/or jitter of a phase locked loop (PLL). The system includes a first PLL configured to generate a first clock signal based on a reference clock signal, a first buffer for providing the reference clock signal to the first PLL, a mixer configured to mix the first clock signal with a second clock signal, an analog-to-digital converter (ADC) configured to convert an output of the mixer to digital data, and a processing circuit configured to process the digital data to determine a phase noise or jitter of the first PLL and generate an output indicative of the phase noise or jitter of the first PLL. The system may include a second PLL configured to generate the second clock signal based on the reference clock signal, and a second buffer for providing the reference clock signal to the second PLL.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully