CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS

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United States of America Patent

APP PUB NO 20240192596A1
SERIAL NO

18376499

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Abstract

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A chemically amplified resist composition is provided comprising (A) a polymer adapted to increase its solubility in an aqueous alkaline under the action of an acid, the polymer comprising repeat units, represented by the formula (A1), and repeat units, represented by the formula (B1), and lacking repeat units adapted to generate an acid upon exposure, and (B) a photoacid generator represented by the formula (PAG-a) or (PAG-b) which generates an acid under the action of KrF excimer laser, ArF excimer laser, electron beams or extreme ultraviolet radiation.

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Patent Owner(s)

Patent OwnerAddress
SHIN-ETSU CHEMICAL CO LTD4-1 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1000005 ?1000005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fukushima, Masahiro Joetsu-shi, JP 148 318
Hatakeyama, Jun Joetsu-shi, JP 692 7607
Ishibashi, Naoki Joetsu-shi, JP 59 723

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