ULTRASONIC INSPECTION APPARATUS AND METHOD

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United States of America Patent

APP PUB NO 20240192175A1
SERIAL NO

18527544

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An ultrasonic inspection apparatus includes a control device 12 that outputs a pulse signal for making an ultrasonic probe 11A transmit an ultrasonic wave to the ultrasonic probe 11A and that is supplied with a waveform signal obtained by converting the received ultrasonic wave from an ultrasonic probe 11B, and that computes a thickness reduction depth of a pipe 1 between the ultrasonic probe 11A and the ultrasonic probe 11B. The control device 12 computes the thickness reduction depth of the pipe 1 by selectively using a reception time of the ultrasonic wave transmitted from the ultrasonic probe 11A, reflected once by an inner surface 3 of the pipe 1, and received by the ultrasonic probe 11B, and a reception time of the ultrasonic wave transmitted from the ultrasonic probe 11A, reflected twice by the inner surface 3 of the pipe 1, and received by the ultrasonic probe 11B.

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Patent Owner(s)

Patent OwnerAddress
HITACHI-GE NUCLEAR ENERGY LTDIBARAKI

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUKUHARA, Yoshizumi Hitachi, JP 3 0
HIRANO, Akihiko Hitachi, JP 55 715
KITAZAWA, So Tokyo, JP 14 156
SAGA, Kaname Tokyo, JP 2 0
YAMADA, Junta Hitachi, JP 2 0

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