TESTING ADCs

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United States of America Patent

APP PUB NO 20240187014A1
SERIAL NO

18285217

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A circuit portion is provided which is arranged to be operable in a test mode. The circuit portion includes a Successive Approximation Register Analog to Digital Converter, SAR ADC, and an input for a reference signal. The SAR ADC is arranged to generate a feedback signal having a duty cycle representing a time taken for the SAR ADC to complete an analogue to digital conversion. The SAR ADC can carry out a comparison of a duty cycle of the reference signal with the duty cycle of the feedback signal, and can generate an output signal comprising a digital representation of the comparison of the reference duty cycle and the feedback duty cycle.

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Patent Owner(s)

Patent OwnerAddress
NORDIC SEMICONDUCTOR ASATRONDHEIM TRONDHEIM TRONDELAG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FON, Henrik Trondheim, NO 4 0

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges254214701 - 1002004006008001000120014001600180020002200240026002800

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