Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)

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United States of America Patent

APP PUB NO 20240175895A1
SERIAL NO

18431503

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Abstract

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An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

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BRUKER NANO INC101 DAGGETT DRIVE SAN JOSE CA 95134

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  • 2024 Application Filing Year
  • B82Y Class
  • 429 Applications Filed
  • 35 Patents Issued To-Date
  • 8.16 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Osechinskiy, Sergey Goleta, US 10 16
Pittenger, Bede Goleta, US 12 33
Ruiter, Anthonius Goleta, US 7 12
Syed-Amanulla, Syed-Asif Minneapolis, US 5 8

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges23623901 - 100200400600800100012001400160018002000220024002600

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