APPARATUS AND METHOD FOR MEASURING DIMENSION
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United States of America Patent
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May 2, 2024
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Oct 26, 2023
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Oct 27, 2022
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Abstract
Disclosed are an apparatus and method for measuring a dimension. The method of measuring a dimension according to an aspect of the present invention includes photographing a target object and generating an image, normalizing the image of the target object, generating normalized estimated dimension information about the target object from the normalized image of the target object using a pre-trained dimension prediction model, and converting the normalized estimated dimension information of the target object into estimated dimension information of the target object.
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