REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD FOR MANUFACTURING REFLECTIVE MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20240142866A1
SERIAL NO

18282493

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Abstract

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Provided are a reflective mask blank, a reflective mask, a method for manufacturing a reflective mask, and a method for manufacturing a semiconductor device, capable of preventing occurrence of electrostatic breakdown in a substrate peripheral edge portion.

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Patent Owner(s)

Patent OwnerAddress
HOYA CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
NAKAGAWA, Masanori Tokyo, JP 50 420

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