SYSTEM AND METHOD FOR IN-SITU PROBING OF A CONDUIT
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United States of America Patent
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Issued Date -
May 2, 2024
app pub date -
Oct 27, 2022
filing date -
Oct 27, 2022
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Abstract
A device for probing an interior of a tube includes an annular frame configured for engagement with a rotor or an orbital element mount. The annular frame presents a mounting surface. An annular buffer layer is positioned radially inward of and concentrically with the annular frame. A flexible annular sealing layer is joined with the annular buffer layer and positioned radially inward of and concentrically with the annular buffer layer. The sealing layer is configured to form a seal with the tube. A rotational layer is positioned between the annular frame and the buffer layer enabling rotation of the annular frame about the annular buffer layer. A process cartridge frame is mounted on the mounting surface and includes three or more process cartridge openings. Each of the cartridge openings is configured to receive a process cartridge. Each process cartridge is rotatively selectable via rotation of the annular frame.
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