EVALUATION CIRCUIT, SEMICONDUCTOR DEVICE, AND EVALUATION METHOD
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United States of America Patent
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Issued Date -
Apr 4, 2024
app pub date -
Jul 11, 2023
filing date -
Sep 30, 2022
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Abstract
An evaluation circuit, a semiconductor device using the evaluation circuit, and an evaluation method using the evaluation circuit are provided to correctly measure the voltage values of individual transistors, while ensuring that there are fewer than four types of measured voltage values. The evaluation circuit includes a first switch element and a second switch element. The first switch element is disposed between a drain of the transistor and a first drain power supply. The second switch element is connected in parallel to the first switch element and disposed between the drain and a second drain power supply. A source of the transistor is electrically connected to A source power supply. A voltage applied to the second drain power supply is equal to a voltage applied to the source power supply.
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