AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME

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United States of America Patent

APP PUB NO 20240110939A1
SERIAL NO

18275437

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present disclosure relates to a method of operating an SPM system including a landing procedure. The landing procedure comprises a first landing stage including a first translation over a first actuation distance by a coarse translation means to bring a probe tip held by an SPM head from an initial separation from a substrate to be probed to a second, more proximal, separation as defined by a characteristic transitional response of the probe tip in proximity to the substrate. Following the first stage a second translation is applied, over a second actuation distance by a fine translation means under feedback control to bring the probe tip to a working separation. Prior to applying the first (coarse) actuation distance an initial optical distance is determined which is indicative of the initial separation, using a detector, preferably a mark sensor. The measured initial optical distance is related to a reference distance so as to determine a deviation. The first actuation distance corresponds the reference distance and the deviation. The disclosure also relates to an SPM system and software product arranged to implement the landing method.

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Patent Owner(s)

Patent OwnerAddress
NEARFIELD INSTRUMENTS B VVARESEWEG 5 ROTTERDAM 3047 AT

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SADEGHIAN, MARNANI Hamed Rotterdam, NL 60 47
YANG, Jianfei Eindhoven, NL 30 100

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