Polymer Analysis Apparatus and Method
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United States of America Patent
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Issued Date -
Apr 4, 2024
app pub date -
Sep 28, 2023
filing date -
Sep 29, 2022
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Abstract
A second polymer is prepared through derivatization of a first polymer. Kendrick Mass Defect (KMD) analysis is applied on a mass spectrum of the second polymer, to thereby produce a plot. Meanwhile, a plurality of mass candidates for a non-primary-chain segment are calculated based on a mass spectrum of the first polymer. The KMD analysis is applied on the plurality of mass candidates, to thereby produce reference images. A mass of the non-primary-chain segment is identified through matching of two KMD analysis results.
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