MARK DETECTION METHOD AND COMPUTER PROGRAM

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United States of America Patent

APP PUB NO 20240104753A1
SERIAL NO

18473109

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Abstract

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An encoding step and an image selection step are performed by a computer 20. In the encoding step, a plurality of partial images D2 of an object are input to a learned VAE model M, and the plurality of partial images D2 are encoded to a plurality of latent variables in a multi-dimensional latent space. In the image selection step, one or more partial images D2 that are likely to include an alignment mark are selected on the basis of a distribution of the plurality of latent variables in the latent space. Thus, a partial image that is likely to include an alignment mark is automatically detected by the computer 20 with the use of the VAE model M. This can lighten a burden on an operator who searches for an alignment mark.

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Patent Owner(s)

Patent OwnerAddress
SCREEN HOLDINGS CO LTDKAMIKAWA NAKAGAWA TEMPLE IN TOKYO KYOTO PREFECTURE JAPAN (POSTCODE 602-8585) JINGDU CITY KYOTO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OKAYAMA, Toshiyuki Kyoto, JP 4 0
SHIMADA, Yoshinori Kyoto, JP 50 1209

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