PHOTOMASK INCLUDING FIDUCIAL MARK AND METHOD OF MAKING A PHOTOMASK

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United States of America Patent

APP PUB NO 20240094625A1
SERIAL NO

18522942

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Abstract

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A method of making a semiconductor device includes forming at least one fiducial mark on a photomask. The method further includes defining a pattern including a plurality of sub-patterns on the photomask in a pattern region. The defining the pattern includes defining a first sub-pattern of the plurality of sub-patterns having a first spacing from a second sub-pattern of the plurality of sub-patterns, wherein the first spacing is different from a second spacing between the second sub-pattern and a third sub-pattern of the plurality of sub-patterns.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHEN, Chia-Jen Hsinchu, TW 98 1413
LEE, Hsin-Chang Hsinchu, TW 203 1090
LIN, Chih-Cheng Hsinchu, TW 79 292
LIN, Ping-Hsun Hsinchu, TW 33 21

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