METHODS OF MEASURING STRCTURES
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United States of America Patent
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Issued Date -
Mar 21, 2024
app pub date -
Nov 21, 2023
filing date -
Apr 5, 2019
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Abstract
A method of measuring a structure includes acquiring azimuth and tilt readings at a first location and second location. Images of the structure are also acquired from the first and second location. The respective distances from the first and second locations to a first and second point on the structure are measured. A scale is established from two positions of the structure depicted in the first or second image of the structure. The distance between the first and second points on the structure is found using the established scale. This distance is used with the azimuth and tilt readings and measured distances from the first and second location to build an epipolar model of the structure. The structure may be a utility pole. Also disclosed are methods of assisting photogrammetric measurements and estimating the class of a utility pole, and methods of determining the compliance status of a utility pole.
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