SYSTEMS AND METHODS FOR SURFACE PROFILE ESTIMATION VIA OPTICAL COHERENCE TOMOGRAPHY

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United States of America Patent

APP PUB NO 20240090768A1
SERIAL NO

17932215

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An optical coherence tomography (OCT) system comprises an interferometer configured to split incident light into a reference beam and a test beam, and to interfere the test beam reflected from the specimen with the reference beam reflected from a reference mirror to produce an interference pattern. The OCT system also comprises a spectrometer configured to analyze spectral components of the interference pattern at non-uniformly sampled wavenumbers. A computer-readable memory of the OCT system is configured to store a measurement model with elements connecting different depth values with different non-uniformly sampled wavenumbers and weighted with weights derived from a power spectral density (PSD) of the incident light for corresponding wavenumbers. The OCT system further comprises a processor configured to determine the profilometry measurements of the specimen as a maximum likelihood estimate of the specimen surface depth by back-projection of the measured intensities with the measurement model.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI ELECTRIC RESEARCH LABORATORIES INCCAMBRIDGE MA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Boufounos, Petros Winchester, US 44 187
Koike, Akino Toshiaki Cambridge, US 19 43
Mansour, Hassan Boston, US 51 199
Orlik, Philip Cambridge, US 139 1190
Parsons, Kieran Cambridge, US 70 832
Rapp, Joshua Somerville, US 2 0

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