SYSTEMS AND METHODS FOR SURFACE PROFILE ESTIMATION VIA OPTICAL COHERENCE TOMOGRAPHY
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United States of America Patent
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Issued Date -
Mar 21, 2024
app pub date -
Sep 14, 2022
filing date -
Sep 14, 2022
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Abstract
An optical coherence tomography (OCT) system comprises an interferometer configured to split incident light into a reference beam and a test beam, and to interfere the test beam reflected from the specimen with the reference beam reflected from a reference mirror to produce an interference pattern. The OCT system also comprises a spectrometer configured to analyze spectral components of the interference pattern at non-uniformly sampled wavenumbers. A computer-readable memory of the OCT system is configured to store a measurement model with elements connecting different depth values with different non-uniformly sampled wavenumbers and weighted with weights derived from a power spectral density (PSD) of the incident light for corresponding wavenumbers. The OCT system further comprises a processor configured to determine the profilometry measurements of the specimen as a maximum likelihood estimate of the specimen surface depth by back-projection of the measured intensities with the measurement model.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC | CAMBRIDGE MA |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Boufounos, Petros | Winchester, US | 44 | 187 |
Koike, Akino Toshiaki | Cambridge, US | 19 | 43 |
Mansour, Hassan | Boston, US | 51 | 199 |
Orlik, Philip | Cambridge, US | 139 | 1190 |
Parsons, Kieran | Cambridge, US | 70 | 832 |
Rapp, Joshua | Somerville, US | 2 | 0 |
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