FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METHOD THEREFOR

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240085493A1
SERIAL NO

18262059

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Abstract

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A flexible probe for microLED defect detection includes: a flexible base and a flexible circuit film layer. The flexible base includes a flexible substrate and flexible protrusions located on the flexible substrate. A circuit for illuminating a microLED to be detected is provided inside the flexible circuit film layer. The flexible circuit film layer is attached to a surface on a side of the flexible base on which the flexible protrusions are provided, at least a portion of the circuit of the flexible circuit film layer is located on the flexible protrusions, and when the flexible probe for MicroLED defect detection is placed on the MicroLED, the circuit on the flexible protrusions abuts against pins of the MicroLED to be detected and is electrically connected to the pins.

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Patent Owner(s)

Patent OwnerAddress
INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU ZHEJIANG314000 15TH FLOOR BUILDING B ZHEJIANG TSINGHUA YANGTZE RIVER DELTA RESEARCH INSTITUTE JIAXING CITY ZHEJIANG PROVINCE JIAXING CITY ZHEJIANG PROVINCE 314000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Xian Jiaxing, CN 27 599
Yang, Qing Jiaxing, CN 496 9882

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