MEASUREMENT ASSEMBLY, MEASUREMENT METHOD, AND MEASUREMENT SYSTEM

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United States of America Patent

APP PUB NO 20240085164A1
SERIAL NO

18513671

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Abstract

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This application provides a measurement assembly, a measurement method, and a measurement system. The measurement assembly includes a support beam and a flush gauge. The support beam includes a reference surface used to fit against a measurement reference surface, and a track extending parallel to the reference surface. The flush gauge includes a main body and a measurement rod. The main body is slidably disposed on the track, and the measurement rod includes a first end and a second end disposed opposite each other. The first end is fixedly connected to the main body, the second end is used to abut against a surface of an object being measured, and the second end is able to movable toward and away from the first end.

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Patent Owner(s)

Patent OwnerAddress
CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITEDLEVEL 19 CHINA BUILDING 29 QUEEN'S ROAD CENTRAL CENTRAL CENTRAL AND WESTERN DISTRICT HONG KONG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HU, Xiaofeng Ningde, CN 28 66
LU, Qihuan Ningde, CN 1 0
SUI, Zhenjie Ningde, CN 2 0

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