SURFACE DENSITY MEASUREMENT METHOD, SURFACE DENSITY MEASUREMENT SYSTEM, AND COMPUTER DEVICE
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United States of America Patent
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Mar 7, 2024
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Oct 3, 2023
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Sep 2, 2022
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Abstract
A surface density measurement method includes: obtaining a single-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a single-sided electrode plate, where the single-sided-electrode-plate transverse scan result includes a blank zone scan result of a blank zone of the single-sided electrode plate and a single-side coating zone scan result of the single-sided electrode plate; obtaining a double-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a double-sided electrode plate, where the double-sided electrode plate is an electrode plate obtained by coating the single-sided electrode plate, and the double-sided-electrode-plate transverse scan result includes a double-side coating zone scan result of the double-sided electrode plate; and obtaining surface densities of the electrode plate by analyzing the single-sided-electrode-plate transverse scan result and the double-sided-electrode-plate transverse scan result.
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