Automated Selection And Model Training For Charged Particle Microscope Imaging
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United States of America Patent
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Issued Date -
Feb 29, 2024
app pub date -
Aug 31, 2022
filing date -
Aug 31, 2022
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Abstract
Disclosed herein are CPM support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method may comprise determining, based on selection data indicating selections of areas of microscopy imaging data, training data for a machine-learning model. The method may comprise training, based on the training data, the machine-learning model to automatically determine one or more areas of microscopy imaging data for performing at least one operation, such as high resolution data acquisition and data analysis. The method may comprise causing a computing device to be configured to use the machine-learning model to automatically determine areas of microscopy imaging data for the at least one operation.
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