ASYMMETRIC PASS THROUGH VOLTAGE FOR REDUCTION OF CELL-TO-CELL INTERFERENCE

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United States of America Patent

APP PUB NO 20240069749A1
SERIAL NO

18236087

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Abstract

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A memory access operation is initiated to read a set of target memory cells of a target wordline of the memory device. During the memory access operation, a read voltage level is caused to be applied to the target wordline. During the memory access operation, a first pass through voltage level is caused to be applied to a first wordline adjacent to the target wordline. During the memory access operation, a second pass through voltage is caused to be applied to a second wordline adjacent to the target wordline, wherein the first pass through voltage level is less than the second pass through voltage level.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC8000 SOUTH FEDERAL WAY POST OFFICE BOX 6 BOISE ID 83707-0006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Benvenuti, Augusto Lallio, IT 29 180
Carnevale, Gianpietro Bottanuco, IT 17 37
Mauri, Aurelio Giancarlo Meda (MB), IT 13 236
Paolucci, Giovanni Maria Milano, IT 12 6
Urbani, Alessio Roma RM, IT 4 7

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