SIGNAL ENHANCEMENT STRUCTURE AND MEASURING METHOD WITH SIGNAL ENHANCEMENT
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United States of America Patent
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Feb 22, 2024
app pub date -
Oct 30, 2023
filing date -
Jul 3, 2020
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Abstract
A signal enhancement structure configured to enhance a signal of a specimen is provided. The signal enhancement structure includes a plurality of nanowires stacked in a first direction, a second direction, and a third direction. The nanowires are extended along at least two directions. A particle of the specimen is on the nanowires or in a gap among the nanowires. A manufacturing method of a signal enhancement structure and a measuring method with signal enhancement are also provided.
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