SPECTROSCOPIC MEASUREMENT DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240060880A1
SERIAL NO

18270880

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Provided is a spectroscopic measurement device capable of improving detection sensitivity to a change in a physical property value such as expansion of a sample to which energy is applied by an infrared ray or the like. The spectroscopic measurement device includes: a stage on which a sample is to be placed; an energy source configured to generate an energy beam to be emitted to a predetermined region of the sample; an electromagnetic wave source configured to generate an electromagnetic wave to be emitted to the sample; an objective lens configured to focus the electromagnetic wave in the predetermined region; two confocal detectors configured to detect the electromagnetic wave reflected by the sample; and a calculation unit configured to calculate, based on each of outputs of the confocal detectors, a change in a physical property value of the sample when the energy beam is emitted to the predetermined region.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO 1056409 ?1056409

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BABA, Shuichi Tokyo, JP 19 145
HIROSE, Takenori Tokyo, JP 31 351
WATANABE, Masahiro Tokyo, JP 569 7223
ZHANG, Kaifeng Tokyo, JP 20 57

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation