METHOD FOR ANALYZING ALPHA-RAY SPECTRUM OBTAINED FROM RADIATION SOURCE
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United States of America Patent
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Issued Date -
Feb 15, 2024
app pub date -
Dec 9, 2021
filing date -
Jan 29, 2021
priority date (Note) -
Published
status (Latency Note)
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Abstract
The present invention relates to a method for analyzing an alpha-ray spectrum obtained from a radiation source, wherein the radiation source includes a first nuclide and a second nuclide that are different from each other, the method comprising the steps of: obtaining simulated spectra for alpha rays emitted from the first nuclide and the second nuclide through a simulation using radioactivity functions of the first nuclide and the second nuclide; measuring alpha rays emitted from the radiation source to obtain an alpha-ray spectrum; and decomposing the alpha-ray spectrum into a first alpha-ray spectrum emitted from the first nuclide and a second alpha-ray spectrum emitted from the second nuclide, on the basis of the simulated spectra.
First Claim
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