AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME
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United States of America Patent
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Issued Date -
Feb 1, 2024
app pub date -
Jul 27, 2023
filing date -
Jul 29, 2022
priority date (Note) -
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Abstract
An automatic measuring device includes a micrometer including a spindle that moves forward and backward to be brought into contact with or away from a workpiece and a displacement detector unit that detects displacement of the spindle, and an automatic operation unit that automates the forward and backward movement of the spindle by power. The automatic operation unit performs a first forward-movement step of moving the spindle forward to bring the spindle into contact with the workpiece, and a contact determination step of determining the contact between the spindle and the workpiece in the first forward-movement step. In the contact determination step, the spindle is determined to be in contact with the workpiece when a change in a position of the spindle detected by the displacement detector unit in the first forward-movement step becomes equal to or less than a predetermined contact determination threshold.
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