OUTLIER DETECTION METHOD OF DETECTING OUTLIERS IN MEASURED VALUES OF A MEASURAND
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United States of America Patent
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Issued Date -
Jan 18, 2024
app pub date -
Jul 13, 2023
filing date -
Jul 13, 2022
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Abstract
A method of detecting outliers in measured values of a measurand is disclosed, comprising the steps of: based on training data determining a combined distribution of differences between individual measured values and the filtered value of the measured value preceding the respective individual measured value to be expected in the application where the method is applied based on difference distribution of first differences of the filtered values of the measured values and a noise distribution of noise included in the measured values. Next, new measured values are identified as outliers when a probability of occurrence of a difference between the respective new measured value and the filtered value of the preceding measured value according to the combined distribution is lower than a predetermined level of confidence.
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