METHODS OF SEPARATING GOOD PROBE STRUCTURES FROM DEFECTIVE PROBE STRUCTURES IN AN ELECTROCHEMICAL FABRICATION SYSTEM

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United States of America Patent

APP PUB NO 20240017990A1
SERIAL NO

18301162

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Abstract

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Electronic test probes formed in a batch have a plurality of multi-material layers wherein at least one of the materials is a sacrificial material and at least one other material is a structural material. Successfully formed or good test probes are separated from unsuccessfully formed or bad test probes

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Patent Owner(s)

Patent OwnerAddress
MICROFABRICA INC7911 HASKELL AVENUE VAN NUYS CA 91406

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frodis, Uri Los Angeles, US 61 889
Kim, Kleun Los Angeles, US 1 0
Larsen, Rulon J Colorado Springs, US 1 0
Le, Duy P San Francisco, US 54 663
Levy, Nina C Los Angeles, US 2 4
McPherson, Dale S Kissimmee, US 17 232
Samiee, Mahmood Glendale, US 2 0
Smalley, Dennis R Newhall, US 214 7959
Thompson, Jeffrey A Van Nuys, US 155 400

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