METHOD FOR DETERMINING CONTACT OR CONNECTION STATE, AND INFORMATION PROCESSING DEVICE

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United States of America Patent

APP PUB NO 20240012026A1
SERIAL NO

18267124

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Abstract

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A determination method according to the present application includes: (A) a step for measuring, at a plurality of frequencies, an S-parameter at the current probe location or in the current coaxial connector or waveguide connection state; (B) a step for calculating a coefficient matrix for fitting a prescribed function matrix to the measured S-parameter frequency properties; (C) a step for calculating a first local outlier factor on the basis of the calculated coefficient matrix; and (D) a determination step for determining, on the basis of the relationship between a threshold and the calculated first local outlier factor, whether a first state in which the probe is contacting the prescribed target, or a second state in which there is a connection failure between the coaxial connector or the waveguide and the prescribed target exists.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY3-1 KASUMIGASEKI 1-CHOME CHIYODA-KU TOKYO 100-8921

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Horibe, Masahiro Tsukuba-shi, JP 18 313
Sakamaki, Ryo Tsukuba-shi, JP 4 1

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