Atomic-force Microscopy for Identification of Surfaces

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United States of America Patent

APP PUB NO 20240012022A1
SERIAL NO

18370923

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.

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Patent Owner(s)

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TRUSTEES OF TUFTS COLLEGEBALLOU HALL MEDFORD MA 02155

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  • 2023 Application Filing Year
  • G01Q Class
  • 37 Applications Filed
  • 16 Patents Issued To-Date
  • 43.25 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miljkovic, Milos Medford, US 9 134
Sokolov, Igor Medford, US 40 810

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges134101 - 100102030405060708090100110120130140150

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