MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD
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United States of America Patent
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Issued Date -
Jan 4, 2024
app pub date -
Sep 18, 2023
filing date -
Mar 18, 2021
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Abstract
A millimeter wave module inspection system includes: an electronic device including at least one processor; and a millimeter wave module including a memory, at least one antenna, and at least one transceiver, wherein the at least one processor is configured to: control an input signal to be input to a transmission signal input terminal of the millimeter wave module; identify an output signal that is output from a reception signal output terminal of the millimeter wave module when the input signal passes through the at least one antenna of the millimeter wave module; identify first data corresponding to a transmission chain gain related to a transmission path of the millimeter wave module stored in the memory and second data corresponding to a reception chain gain related to a reception path of the millimeter wave module, the first data and the second data being stored in the memory; and determine whether the millimeter wave module is abnormal based at least on the identified output signal, the first data, and the second data.
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