Structured Film and Method of Using Same to Form a Pattern on a Substrate

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United States of America Patent

APP PUB NO 20240004282A1
SERIAL NO

18255695

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Abstract

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A structured film for forming a pattern on a substrate includes a polymeric support layer, an adhesive layer, an etch resist layer disposed between the polymeric support layer and the adhesive layer, a structured resin layer disposed between the polymeric support layer and the etch resist layer, and one or more unstructured layers disposed between the etch resist layer and the adhesive layer. The structured resin layer has a structured major surface including a plurality of engineered structures. The etch resist layer at least partially fills spaces between adjacent engineered structures to substantially planarize the structured major surface. Methods of using the structured film to form a pattern on a substrate are described.

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Patent Owner(s)

Patent OwnerAddress
3M INNOVATIVE PROPERTIES COMPANYPO BOX 33427 ST PAUL MN 55133-3427

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brott, Robert L Woodbury, US 93 1824
Gotrik, Kevin W Hudson, US 60 17
Lyons, Christopher S St. Paul, US 95 2024
Nelson, Caleb T McKinney, US 48 34
Nelson, James M Lino Lakes, US 100 1029
Savvateev, Vadim St. Paul, US 6 153
Schardt, Craig R Woodbury, US 76 1733
Solomon, Jeffrey L Centerville, US 40 755
Stensvad, Karl K Eagan, US 41 54
Theiss, Steven D Woodbury, US 27 4423
Wolk, Martin B Woodbury, US 158 3615

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