Method For Density Measurement Of Materials Using Computed Tomography With Diffraction Artifact Correction

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United States of America Patent

APP PUB NO 20240003797A1
SERIAL NO

18345197

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Abstract

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Embodiments determine the density of materials and objects imaged using computed tomography (CT). An embodiment co-images a material of unknown density with a calibrant of known density. The digitally reconstructed CT images are segmented into the unknown material phase and the known material phases of the calibrant. Image intensity histograms of the unknown material are obtained. Using the known calibrant densities, an intensity-density mapping is calculated to determine the unknown material density based on its measured CT intensity. The method described herein utilizes a novel deconvolution of the intensity histograms to correct for CT imaging artifacts that impact the material phase intensities. The density of micronized materials and features such as particles, microspheres, porosity, and multiphase composites which are difficult to measure with conventional techniques can be measured using the embodiments. The design of custom sample holders for co-imaging a material with the calibrant and uncertainty estimation are also described.

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Patent Owner(s)

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DIGIM SOLUTION LLC500 WEST CUMMINGS PARK SUITE 3650 WOBURN MA 01801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Clark, Andrew Garrison Cambridge, US 1 0
Wong, Jeffrey Michael Chelmsford, US 1 0
Zhang, Shuang Winchester, US 87 168
Zhu, Aijun Winchester, US 16 83

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