Method For Density Measurement Of Materials Using Computed Tomography With Diffraction Artifact Correction
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Issued Date -
Jan 4, 2024
app pub date -
Jun 30, 2023
filing date -
Jul 1, 2022
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Abstract
Embodiments determine the density of materials and objects imaged using computed tomography (CT). An embodiment co-images a material of unknown density with a calibrant of known density. The digitally reconstructed CT images are segmented into the unknown material phase and the known material phases of the calibrant. Image intensity histograms of the unknown material are obtained. Using the known calibrant densities, an intensity-density mapping is calculated to determine the unknown material density based on its measured CT intensity. The method described herein utilizes a novel deconvolution of the intensity histograms to correct for CT imaging artifacts that impact the material phase intensities. The density of micronized materials and features such as particles, microspheres, porosity, and multiphase composites which are difficult to measure with conventional techniques can be measured using the embodiments. The design of custom sample holders for co-imaging a material with the calibrant and uncertainty estimation are also described.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
DIGIM SOLUTION LLC | 500 WEST CUMMINGS PARK SUITE 3650 WOBURN MA 01801 |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Clark, Andrew Garrison | Cambridge, US | 1 | 0 |
Wong, Jeffrey Michael | Chelmsford, US | 1 | 0 |
Zhang, Shuang | Winchester, US | 87 | 168 |
Zhu, Aijun | Winchester, US | 16 | 83 |
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