Measurement Sensitivity Calculation Method, Measurement Sensitivity Calculation Device, Measurement Sensitivity Calculation Program, and Optical Measurement Device
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United States of America Patent
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Nov 16, 2023
app pub date -
Sep 22, 2021
filing date -
Sep 22, 2021
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Abstract
In a measurement target model representing a measurement target, this measurement sensitivity calculation device uses, as measurement sensitivity, an optical path length difference between a first optical path length indicating the length of an optical path through which light emitted from a light emitter to the measurement target travels before being received by a first light receiver spaced apart by a first distance from the light emitter and a second optical path length indicating the length of an optical path through which light emitted from the light emitter travels before being received by a second light receiver spaced apart by a second distance from the light emitter, calculates the measurement sensitivity for each depth of the measurement target, and outputs the measurement sensitivity calculated for each depth of the measurement target.
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