SUBSTRATES FOR OPTICAL AND ELECTRON MICROSCOPY OF 2D MATERIALS
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United States of America Patent
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Issued Date -
Oct 19, 2023
app pub date -
Mar 9, 2023
filing date -
Apr 16, 2022
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Abstract
One or more embodiments relates to a substrate consisting of an ultrathin, conductive, shapeless metal oxide on SiO2/Si substrate. In one embodiment, the substrate facilitates experimental characterization of 2D materials simultaneously via optical identification of the single monolayer thickness of 2D materials and electron-based spectro-microscopy characterization.
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