SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYSIS METHOD

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United States of America Patent

APP PUB NO 20230332999A1
SERIAL NO

18332865

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Abstract

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A specimen analysis system includes: a measurement data acquisition unit that acquires measurement data of particles obtained from a flow cytometer measuring the particles contained in a measurement specimen prepared by adding a reagent to a sample; an output mode information acquisition unit that acquires output mode information indicating an output form of the measurement data; and an output unit configured to output the measurement data in the output form in accordance with the output mode information.

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Patent Owner(s)

Patent OwnerAddress
SYSMEX CORPORATIONKOBE-SHI HYOGO 651-0073

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TATSUTANI, Hiroo Kobe-shi, JP 36 153
TSUJI, Tomohiro Kobe-shi, JP 76 412

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