APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR FOR USE IN SUCH AN APPARATUS
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United States of America Patent
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Issued Date -
Oct 5, 2023
app pub date -
Mar 10, 2023
filing date -
Mar 10, 2023
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Abstract
An apparatus for testing semiconductor devices is disclosed. In one example, the apparatus includes a rolling contactor comprising a first cylindrical rotatable holder, a plurality of test pin sets, each one of the test pin sets being connected to the cylindrical rotatable holder. Each one of the test pin sets comprises a plurality of test pins, and a substrate configured to support a plurality of semiconductor devices. The semiconductor devices comprising one or more contact elements on a main surface thereof remote from the substrate, wherein the first cylindrical rotatable holder and the substrate are arranged relative to each other so that due to a rotating movement of the first cylindrical rotatable holder the test pins of the test pin sets are successively contacted with the contact elements of the semiconductor devices.
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