SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE

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United States of America Patent

APP PUB NO 20230301088A1
SERIAL NO

17806111

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Abstract

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A semiconductor memory device of an embodiment includes: a semiconductor layer extending in a first direction; a gate electrode layer containing at least one element selected from a group consisting of molybdenum (Mo), tungsten (W), ruthenium (Ru), and cobalt (Co); a first insulating layer provided between the semiconductor layer and the gate electrode layer; a charge storage layer provided between the first insulating layer and the gate electrode layer; a second insulating layer provided between the charge storage layer and the gate electrode layer; a third insulating layer provided between the second insulating layer and the gate electrode layer; and a metal oxide layer provided between the third insulating layer and the gate electrode layer and containing at least one first metal element selected from a group consisting of titanium (Ti), molybdenum (Mo), tungsten (W), and tantalum (Ta).

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Patent Owner(s)

Patent OwnerAddress
KIOXIA CORPORATIONTOKYO 108-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUJII, Kenichi Yokkaichi, JP 187 2409
FUKUSHIMA, Takashi Yokkaichi, JP 114 1188
KATO, Masaki Yokkaichi, JP 405 3629
KATOU, Kaihei Yokkaichi, JP 2 0
OHSAWA, Saho Yokkaichi, JP 1 0
OHTORI, Hiroyuki Yokkaichi, JP 12 67
SAKAI, Yuji Yokkaichi, JP 124 964
SAWABE, Ryosuke Yokkaichi, JP 9 41

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