X-RAY INSPECTION APPARATUS AND METHOD
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United States of America Patent
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Issued Date -
Sep 7, 2023
app pub date -
Feb 28, 2023
filing date -
Mar 1, 2022
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Abstract
There is provided an X-ray product inspection apparatus and a method of controlling the X-ray product inspection apparatus. The apparatus comprises an X-ray generator comprising an aperture for outputting an X-ray beam, and a shutter apparatus arranged across the aperture. The shutter apparatus comprises a moveable shutter plate having a barrier portion of X-ray attenuating material configured to substantially block the X-ray beam; and an actuator mechanism configured to move the shutter plate between a closed position in which the barrier portion is disposed across the aperture to substantially block the X-ray beam and an open position in which the barrier portion is offset from the aperture to enable at least partial emission of the X-ray beam.
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