HIGH DENSITY LINEAR CAPACITOR IN SEMICONDUCTOR TECHNOLOGIES

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United States of America Patent

APP PUB NO 20230253400A1
SERIAL NO

17650233

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Abstract

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A device includes a first plurality of MEOL interconnects coupled to a second node that extends in a first direction. The first plurality of MEOL interconnects includes first and second subsets of MEOL second-terminal interconnects. The device includes a second plurality of MEOL interconnects coupled to a first node that extends in the first direction. The second plurality of MEOL interconnects includes first and second subsets of MEOL first-terminal interconnects. The first subsets of MEOL first-terminal and second-terminal interconnects are interleaved and are a first subset of interleaved MEOL interconnects. The second subsets of MEOL first-terminal and second-terminal interconnects are interleaved and are a second subset of interleaved MEOL interconnects. The device includes at least one of a first plurality of gate interconnects or a first plurality of OD regions extending in a second direction orthogonal to the first direction between the first and second subsets of interleaved MEOL interconnects.

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Patent Owner(s)

Patent OwnerAddress
QUALCOMM INCORPORATED5775 MOREHOUSE DRIVE SAN DIEGO CA 92121-1714

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ALLADI, Dinesh Jagannath San Diego, US 27 98
DAI, Liang San Diego, US 29 216
LEE, Bruce Irvine, US 44 901
TIRUPATHI, Chandra Satya Priyanka Bangalore, IN 1 1

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