SENSOR
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United States of America Patent
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Issued Date -
Jul 13, 2023
app pub date -
Mar 13, 2023
filing date -
Feb 26, 2014
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Abstract
A sensor measurement device includes: an impedance analyzer to determine an impedance of a sample; a first antenna configured to generate electromagnetic radiation having a first wavelength; an impedance-matching device, positioned in a radiation path between the first antenna and the sample, to receive the electromagnetic radiation from the first antenna and transmit electromagnetic radiation of the first wavelength into the sample, the impedance-matching device comprising a metasurface including: a substrate having a thickness no greater than the first wavelength of the electromagnetic radiation; and a plurality of elements supported by the substrate, wherein: the plurality of elements are spaced apart from one another across the substrate, each element has a first dimension no greater than the first wavelength of the electromagnetic radiation, and at least two elements of the plurality of elements differ in one or more of shape or size; and a second antenna configured to receive the electromagnetic radiation from the sample.
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