Memory device test mode access

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United States of America Patent

PATENT NO 11854637
APP PUB NO 20230178163A1
SERIAL NO

18103603

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Abstract

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A system includes a memory device and a processing device coupled to the memory device. The processing device is configured to switch an operating mode of the memory device between a test mode and a non-test mode. The system further includes a test mode access component that is configured to access the memory device while the memory device is in the test mode to perform a test mode operation.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC8000 SOUTH FEDERAL WAY BOISE ID 83716

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Spica, Michael R Eagle, US 11 20
Springberg, David G Fort Collins, US 9 18

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