DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
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United States of America Patent
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Issued Date -
Jun 8, 2023
app pub date -
May 6, 2021
filing date -
May 8, 2020
priority date (Note) -
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status (Latency Note)
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Abstract
An apparatus, including a scanning probe microscope base that includes a configured to be secured to an end of an insert in a cryostat; a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert; and a damping system disposed between the frame and the top and comprising a bellows that seals the end of the insert. This sealing separates an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also positions an upper surface of the top in the UHV environment.
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