THREE-DIMENSIONAL SHAPE MEASURING METHOD AND THREE-DIMENSIONAL SHAPE MEASURING APPARATUS

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United States of America Patent

APP PUB NO 20230175840A1
SERIAL NO

18075026

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Abstract

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A three-dimensional shape measuring method includes: a first step to: project first and second projection images on a target object, wherein the first projection images include row-direction stripe patterns different from each other, and the second projection images include column-direction stripe patterns different from each other, and obtain first and second captured images of the target object, wherein the first captured images are captured while the first projection images are projected, and the second captured images are captured while the second projection images are projected; a second step to identify a corresponding projection pixel of the first and second projection images, wherein the corresponding projection pixel corresponds to each of captured pixels of the first and second captured images; and a third step to identify a 3D shape of the target object based on a result of the second step.

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Patent Owner(s)

Patent OwnerAddress
TOHOKU UNIVERSITY2-1-1 KATAHIRA AOBA-KU SENDAI-SHI MIYAGI 9808577 ?9808577
KONICA MINOLTA INC2-7-2 MARUNOUCHI CHIYODA-KU TOKYO 1007015 ?1007015

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hashimoto, Koichi Sendai-shi, JP 149 2010
Inagaki, Yoshihiro Tokyo, JP 49 1980
Ito, Hidechika Sendai-shi, JP 1 1
Kagami, Shingo Sendai-shi, JP 7 49
Suzuki, Daichi Tokyo, JP 53 200
Toso, Yoshiyuki Toyokawa-shi, JP 29 213

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