METHOD FOR OBTAINING THE PROFILE OF A SURFACE MOVING IN RELATION TO THE SYSTEM
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United States of America Patent
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Issued Date -
Jun 1, 2023
app pub date -
Apr 27, 2021
filing date -
Apr 27, 2020
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Abstract
A method for obtaining the profile of the outer surface (22) of a medium (21) having a median plane (23) comprising the following steps: obtaining two time signals A and B (1002), for, at each instant, a same geometrical target on a readout line of the outer surface (22); determining at least one Doppler frequency (2001) associated with each time signal A and B; sampling each time signal A and B (2002) at a frequency greater than 2 times the Doppler frequency to obtain a payload signal; determining an envelope (2004) of the payload signal of each signal A and B; performing a relative combination between the envelopes of each signal A and B (3001) to obtain a monotonic and bijective function F; and determining the profile of the outer surface (3002) using a calibration of the function F.
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