Radiation analysis system, charged particle beam system, and radiation analysis method

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United States of America Patent

PATENT NO 12078763
APP PUB NO 20230161053A1
SERIAL NO

17917200

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Abstract

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This radiation analysis system comprises a transition edge sensor that detects radiation, a current detection mechanism that detects a current flowing in the transition edge sensor, and a computer sub-system that processes a current detection signal from the current detection mechanism. The computer sub-system is characterized by executing: a process for calculating a baseline current of the current detection signal; a process for calculating a wave height value of a signal pulse produced in the detection signal when the transition edge sensor has detected radiation; a process for acquiring correlation data based on the baseline current and the wave height value; and a process for correcting the wave height value of the signal pulse, or an energy value calculated from the wave height value, on the basis of the correlation data and the baseline current from before production of the signal pulse when radiation having unknown energy is detected.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takano, Akira Tokyo, JP 105 1272
Tanaka, Keiichi Tokyo, JP 226 4320

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