X-ray scanning system with high x-ray energy
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United States of America Patent
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Mar 26, 2024
Grant Date -
May 4, 2023
app pub date -
Oct 4, 2022
filing date -
Nov 20, 2014
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Abstract
An x-ray scanning system, and corresponding method, includes an x-ray source that produces incident x-ray radiation having end-point x-ray energy, which, in various embodiments, can be greater than about 200 keV, between about 200 keV and about 500 keV, or greater than about 500 keV. The system also includes a disk chopper wheel that can be irradiated by and attenuate the incident x-ray radiation. The disk chopper wheel further defines one or more slits configured to pass the incident x-ray radiation through the disk chopper wheel for scanning a target. In some embodiments, the high end-point x-ray energies with disk chopper wheels are facilitated by forming the incident x-ray radiation as a collimated fan beam and/or orienting the chopper wheel with a wheel plane substantially non-perpendicular to a fan beam plane, increasing effective thickness of a disk chopper wheel to attenuate incident x-rays of higher energies.
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